Ключевые слова: magnets, HTS, YBCO, tape, X-ray diffraction, lattice parameter, nanocomposites, mechanical properties, strain effects, phase composition, experimental results
Hanisch J., Falter M., Backer M., Rikel M., Driessche I., Meledin A., Rijckaert H., Bennewitz J., Diez-Sierra J., Sadewasser M., Koliotassis L., Lopez-Dominguez P.
Ключевые слова: HTS, YBCO, coated conductors, chemical solution deposition, reel-to-reel process, nanocomposites, substrate Ni-W, fabrication, doping effect, nanoscaled effects, nanoparticles, critical current, distribution, uniformity, angular dependence, critical caracteristics, Jc/B curves, pinning force, temperature dependence, magnetic field dependence, X-ray diffraction, microstructure, commercialization
Ключевые слова: Bi2212, bulk, melting, casting process, tubes, thermal conductivity, anisotropy, specific heat, temperature dependence, resistivity, experimental results
Hanisch J., Muller R., Huhtinen H., Paturi P., Driessche I.V., Backer M., Rikel M., Rijckaert H., Bennewitz J., Buysser K.D., Dнez-Sierra J., Lуpez-Dominguez P., Khan M.Z.*, Falte M., Schafer S., Schunk S.A.
Ключевые слова: HTS, YBCO, nanocomposites, nanoscaled effects, thin films, substrate LaAlO3, chemical solution deposition, X-ray diffraction, microstructure, lattice parameter, critical current density, transport currents, magnetic field dependence, critical caracteristics, angular dependence, experimental results
Ключевые слова: HTS, Bi2212, bulk, tubes, fabrication, melting, casting process, neutron diffraction, resistivity, anisotropy, texture, temperature dependence, experimental results
Ключевые слова: magnetic cloak, shields, HTS, Bi2212, bulk, coated conductors, REBCO, modeling, numerical analysis
Bottura L., Larbalestier D.C., Scheuerlein C., Rikel M.O., Hellstrom E.E., Jiang J., Kametani F., Michiel M.D., Ballarino A., Kadar J., Andrieux J., Doerrer C.
Ключевые слова: HTS, Bi2212/Ag, wires, fabrication, melting, phase formation, oxygenation treatments, PIT process, X-ray diffraction
Bottura L., Sugano M., Scheuerlein C., Rikel M.O., Ballarino A., Bjoerstad R., Hudspeth J., Grether A.
Ключевые слова: HTS, YBCO, YGdBCO, coated conductors, DI-Bi2223, tapes, Bi2212, wires round, mechanical properties, stress effects, strain effects, transverse stress, X-ray diffraction, critical caracteristics, critical current, degradation studies, n-value, lattice parameter, experimental results, electromechanical analysis
Bottura L., Sugano M., Scheuerlein C., Ballarino A., Rikel M., Bjoerstad R., Hudspeth J., Grether A.
Ключевые слова: presentation, LTS, Nb3Sn, mechanical properties, synchrotron, X-ray diffraction, texture, stress effects, strain effects, lattice parameter, compression, measurement setup, tensile tests, HTS, Bi-based systems, REBCO, Bi2212, n-value, critical caracteristics, critical current, degradation studies, MgB2, Bi2223, transverse stress, elastic behavior
Bottura L., Sugano M., Scheuerlein C., Rikel M.O., Jiang J., Michiel M.D., Ballarino A., Matras M., Bjoerstad R., Hudspeth J.
Ключевые слова: HTS, Bi2212, wires round, densification, mechanical properties, strain effects, degradation studies, critical caracteristics, critical current, overpressure processing, strain effects, X-ray diffraction, measurement setup, n-value, lattice parameter, temperature dependence, thermal expansion
Bottura L., Larbalestier D.C., Scheuerlein C., Rikel M.O., Hellstrom E.E., Jiang J., Kametani F., Michiel M.D., Ballarino A., Kadar J., Andrieux J., Doerrer C.
Granados X., Puig T., Palau A., Obradors X., Pomar A., Mestres N., Coll M., Ricart S., Zalamova K., Llordes A., Chen H., Vlad V.R., Martinez-Julian F., Rikel M.
Ключевые слова: power equipment, commercialization, FCL resistive, HTS, Bi2212, bulk, tubes, design parameters, test results
Ключевые слова: presentation, HTS, Bi2212, bulk, fabrication, FCL resistive, power equipment, grain boundaries, microstructure, grain alignment
Marken K., Bock J., Miao H., Matsumoto A., Arsac S., Hellstrom E.E., Pavard S., Motowidlo L., Rikel M.O.(Mark.Rikel@Nexans.com), Soileux E., Ehrenberg J., Bruzek C.
Ключевые слова: HTS, Bi2212/Ag, precursors, composition, critical current, microstructure, tapes, critical caracteristics, fabrication
Ключевые слова: HTS, Bi2212/Ag, tapes, heat treatment, fabrication
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